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This topic center focuses on the latest  developments, acheivements, and successes for our sponsors involved in developing design, test and inspection solutions for 3D integration schemes.
 
 

3D Design and Test In-Depth (4 postings)

By Q3D Notes On Nov. 18, 2009
There is a natural progression that emerging technologies follow as they make their way from the drawing board to market adoption and volume production. As such, each sector of the supply chain is called to action at different stages along that technology’s evolution. At each bend in the road, the emerging technology becomes a driver for process development, next-generation manufacturing tools, new materials, design tools, inspection tools, test, measurement and reliability methodologies, etc. Read More>>
By Françoise Von Trapp On Oct. 11, 2009
There’s no doubt about it, IMEC’s 3D TSV technology's march towards maturity is picking up speed. At last week’s technology forum, Pol Marchal, principal scientist of IMEC’s 3D-SoC design initiative, gave us an update on progress since last year, analogizing the evolution with raising a leopard cub from baby to adulthood – or as he titled his presentation, “Growing up from Baby to Killer Technology.” Read More>>
By Françoise Von Trapp On Jul. 02, 2009
Contributed by Yann Guillou, ST Ericsson. Read More>>
By Françoise Von Trapp On Jul. 02, 2009
Although it appears to those developing 3D IC integration processes that the design community hasn’t been heeding the call for the much needed design tools, after talking with Lisa McIlrath of R3 Logic, I realized there’s a lot more to it than that. In fact, the message has been heard, but these things are more convoluted than we think. In fact, it's a bit of a cart-before-the-horse situation. How can design tools be developed until the process technologies, characterization, and paramaters have been determined, and prototypes tested? Read More>>
 
 

Press Releases (12 postings)

By Françoise Von Trapp On Feb. 02, 2010
At DesignCon in Santa Clara, Mentor Graphics announced delivery of full-wave 3D electromagnetic (EM) analysis functionality to address the advanced simulation needs of engineers designing PCBs and packages that utilize high-speed interconnect technologies such as SERDES, which operate at multi-gigabit-per-second speeds. Read More>>
By Françoise Von Trapp On Jan. 28, 2010
In a double-barreled press release, SUSS MicroTec announced the sale of its Test Systems Division to Cascade Microtech, Inc., a worldwide supplier of precise electrical measurement and test of integrated circuits; as well as a strategic partnership between the two companies to address the growing device complexities of emerging semiconductor technologies such as 3D TSV manufacturing and test. Read More>>
By Françoise Von Trapp On Jan. 21, 2010
Global research center, Leti, located in Grenoble France, and 3D IC EDA company R3Logic,announced that they will combine their expertise in 3D silicon integration and packaging. Read More>>
By Françoise Von Trapp On Jan. 13, 2010
ALLVIA, the first through-silicon via (TSV) foundry, has completed the integration of a silicon interposer between a semiconductor die and an organic or ceramic substrate and completed full reliability testing. This 3D integration of substrates is all made possible with ALLVIA’s through-silicon vias. Samples and reliability data are now being made available to interested customers. Read More>>
By Françoise Von Trapp On Jan. 12, 2010
Rudolph Technologies, Inc. announced it has received multiple orders for its NSX® and WaferScanner™ Inspection Systems from STATS ChipPAC Ltd. The systems will be used for high-throughput inspection during each step of the eWLB (embedded wafer-level ball grid array) process. Shipments commenced in 4Q09 and will continue through 1Q10. Read More>>
 
 

White Papers (1 file)

 
 

Forums (3 forums , 4 discussions)

Design Forum (Discussions: 2)
Technlogy Q&A (Discussions: 1)
Last Post: Re:Design Issues
By Françoise Von Trapp on Jan. 19, 2010
Test Forum (Discussions: 1)
Last Post: Re:On the road to resolving te... (concluded)
By Françoise Von Trapp on Dec. 21, 2009
 
 

Message Board (2)

we would like to see planar

we would like to see planar monolithic structures come closer to emulating 3 dimensional fluid processing mechanisms through such.

The 3D process technology

The 3D process technology seems to be well in hand... now the real work needs to start! 3D design will be as different and as challenging as the change from bipolar to CMOS. A mindset change to now optimize a design by process separation and 3D proximity is going to produce entirely new solutions and applications.
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Videos (1)

One-on-one interview with Ricardo Borges, senior project marketing manager, silicon engineerin... Read More>>

 
 

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